Shane Huntington

Fibre-Optics and Photonics

As technology advances, the realm of the "Nano" world becomes more and more accessible. The examination of materials and devices on this scale is a cornerstone of the Nanotechnology and Biotechnology industries.

Within the Scanning Nanoprobe and Raman Microscopy Facility, we have the ability to examine a variety of samples on an atomic scale. Three complementary Atomic Force Microscopes are used in association with a Raman Spectrometer to fully characterise NanoScale Samples.

The Atomic Force Microscope is used to measure physical characteristics such as topography, hardness, viscosity, magnetic field strength, friction etc etc. Recent additions to the AFM also now provide optical images that have a resolution beyond the classical diffraction limit (<50nm).

Atomic Force Microscope image of a Micro-Fresnel Lens, about ½ the size of a human hair with nano features

The Raman Spectrometer enables us to examine the spectral characteristics of samples, and thus determine their composition. This has particular applications in the disciplines of Art Authentication and Forensic Science.

Of particular interest at this point are the ongoing projects in Photonics. As a member of the Australian Photonics Cooperative Research Centre I have strong connections with the field leaders in Sydney and Canberra.

To date in 2001 we have already patented two new pieces of technology that have heavily influenced the Photonics (Telecommunications) community with our etching and characterisation techniques. This is an exciting area of frontier research within which we are heavily involved.

Selected Publications:

1. Canning J, Sommer K, Huntington ST, Carter A, Optics Communications, Vol.199, pp.375-381, 2001.
2. Huntington ST, Horsfall A, Rhodes SK, Walford JN, Barty A, Nugent KA, Roberts A, Scholten AE, Near Field Optics: Principles and Applications, World Scientific, p.43-57, 2000.
3. Huntington ST, Nugent K A, Roberts A, Lo K.M, Mulvaney P, J. Appl. Phys., 82 (2), pp. 510-513, 2000.
4. Huntington ST, Ashby S, Love JD, Elias M, Electronics Letters, Vol.36 (2), pp.121-122, 2000.